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IEC 62276:2012 (EN-FR)

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition:
- terms and definitions are rearranged in accordance with the alphabetical order;
- "reduced LN" is appended to terms and definitions;
- "reduced LT" is appended to terms and definitions;
- reduction process is appended to terms and definitions.

General Information

Status : WITHDRAWN
Standard Type: Main
Document No: IEC 62276:2012 (EN-FR)
Document Year: 2012
Pages: 82
Edition: 2.0
  • Section Volume:
  • TC 49 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
  • ICS:
  • 31.140 Piezoelectric devices

Life Cycle

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IEC 62276:2012 (EN-FR)
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