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IEC 62276:2005

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.

General Information

Status : WITHDRAWN
Standard Type: Main
Document No: IEC 62276:2005
Document Year: 2005
Pages: 34
Edition: 1.0
  • Section Volume:
  • TC 49 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
  • ICS:
  • 31.140 Piezoelectric devices

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WITHDRAWN
IEC 62276:2005
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