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IEC 60749-3:2002

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection

Standard Details

Aims at verifying that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types.The contents of the corrigendum of August 2003 have been included in this copy.

General Information

Status : WITHDRAWN
Standard Type: Main
Document No: IEC 60749-3:2002
Document Year: 2002
Pages: 7
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

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WITHDRAWN
IEC 60749-3:2002
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