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DIN

DIN EN 15991 : 2011

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

General Information

Status : WITHDRAWN
Standard Type: Main
Document No: DIN EN 15991 : 2011
Document Year: 2011

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WITHDRAWN
DIN EN 15991 : 2011
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