logo

Standards Manage Your Business

We Manage Your Standards

SAE

SAE AS6171/2A : 2017

Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Using SEM Test Methods

Standard Details

This document describes the requirements of the following test methods for counterfeit detection of electronic components:aMethod A: General EVI, Sample Selection, and HandlingbMethod B: Detailed EVI, including Part Weight measurementcMethod C: Testing for RemarkingdMethod D: Testing for ResurfacingeMethod E: Part Dimensions measurementfMethod F: Surface Texture Analysis using SEMThe scope of this document is focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.

Cross Reference:

General Information

Status : Revised
Standard Type: Main
Document No: SAE AS6171/2A : 2017
Document Year: 2017
Pages: 31

Life Cycle

Currently Viewing

Revised
SAE AS6171/2A : 2017
Knowledge Corner

Expand Your Knowledge and Unlock Your Learning Potential - Your One-Stop Source for Information!

© Copyright 2024 BSB Edge Private Limited.

Enquire now +