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Status : Active
Standard Type : Main
Document No : ISO 19668:2017
Document Year : 2017
Pages : 24
Edition : 1
Section Volume : Electron spectroscopies (ISO/TC 201/SC 7.)
ISO 19668:2017 specifies a procedure by which elemental detection limits in X-ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported. This document is applicable to homogeneous materials and is not applicable if the depth distribution of elements is inhomogeneous within the information depth of the technique.