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IEC 62526:2007

Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Standard Details

Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 62526:2007
Document Year: 2007
Pages: 123
Edition: 1.0
  • Section Volume:
  • TC 91 Electronics assembly technology
  • ICS:
  • 25.040.01 Industrial automation systems in general

Life Cycle

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ACTIVE
IEC 62526:2007
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