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ISO 15625:2014

Silk — Electronic test method for defects and evenness of raw silk

Standard Details

ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.

It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.

General Information

Status : Published
Standard Type: Main
Document No: ISO 15625:2014
Document Year: 2014
Pages: 15
Edition: 1

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ISO 15625:2014
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