IEC 60749-26:2025 (EN-FR)

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

Standard Details

IEC 60749-26:2025 establishes the procedure for testing, evaluating, and classifying components and microcircuits in accordance with their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The purpose of this document is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type. Repeatable data will allow accurate classifications and comparisons of HBM ESD sensitivity levels. ESD testing of semiconductor devices is selected from this test method, the machine model (MM) test method (see IEC 60749‑27) or other ESD test methods in the IEC 60749 series. Unless otherwise specified, this test method is the one selected.
This edition includes the following significant technical changes with respect to the previous edition:
a) new definitions have been added;
b) text has been added to clarify the designation of and allowances resulting from “low parasitics”. The new designation includes the maximum number of pins of a device that can pass the test procedure.

General Information

Status : ACTIVE

Standard Type: Main

Document No: IEC 60749-26:2025 (EN-FR)

Document Year: 2025

Pages: 105

Edition: 5.0

Section Volume:
TC 47 Semiconductor devices

ICS:
31.080.01 Semiconductor devices in general

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IEC 60749-26:2025 (EN-FR)

IEC 60749-26:2025 (EN-FR)

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