Knowledge Gateway
Unlock your learning potential with industry insights and standards that matter. Share your email to begin.
Unlock your learning potential with industry insights and standards that matter. Share your email to begin.
Status : Active
Standard Type : Main
Document No : ISO/TS 10867:2019
Document Year : 2019
Pages : 17
Edition : 2
Section Volume : Nanotechnologies (ISO/TC 229.)
It provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNTs in a sample and their relative integrated PL intensities.
The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTs in a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.