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Status : Withdrawn
Standard Type : Main
Document Year : 2010
Pages : 14
Edition : 1
Section Volume : Nanotechnologies (ISO/TC 229.)
ISO/TS 10867:2010 provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities.
The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections.