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IEC TS 62607-9-1:2021

Nanomanufacturing - Key control characteristics - Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements - Magnetic force microscopy

Standard Details

IEC TS 62607-9-1:2021(E) establishes a standardized method to characterize spatially varying magnetic fields with a spatial resolution down to 10 nm for flat magnetic specimens by magnetic force microscopy (MFM). MFM primarily detects the stray field component perpendicular to the sample surface. The resolution is achieved by the calibration of the MFM tip using magnetically nanostructured reference materials.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC TS 62607-9-1:2021
Document Year: 2021
Pages: 63
Edition: 1.0
  • Section Volume:
  • TC 113 Nanotechnology for electrotechnical products and systems

Life Cycle

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ACTIVE
IEC TS 62607-9-1:2021
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