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IEC TS 62607-6-26:2025

Nanomanufacturing - Key control characteristics - Part 6-26: Graphene-related products - Fracture strain and stress, Young’s modulus, residual strain and residual stress: bulge test

Standard Details

IEC TS 62607-6-26:2025, which is a Technical Specification, establishes a standardized method to determine the mechanical key control characteristics (KCCs)
• Young's modulus (or elastic modulus),
• residual strain,
• residual stress, and
• fracture stress
of 2D materials and nanoscale films using the
• bulge test.
The bulge test is a reliable method where a pressure differential is applied to a freestanding film, and the resulting deformation is measured to derive the mechanical properties.
• This method is applicable to a wide range of freestanding 2D materials, such as graphene, and nanometre-thick films with thicknesses typically ranging from 1 nm to several hundred nanometres.
• This document ensures the characterization of mechanical properties essential for assessing the structural integrity and performance of materials in applications such as composite additives, flexible electronics, and energy harvesting devices.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC TS 62607-6-26:2025
Document Year: 2025
Pages: 26
Edition: 1.0
  • Section Volume:
  • TC 113 Nanotechnology for electrotechnical products and systems

Life Cycle

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IEC TS 62607-6-26:2025
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