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ISO 17297:2025

Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary

Standard Details

This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).

General Information

Status : Published
Standard Type: Main
Document No: ISO 17297:2025
Document Year: 2025
Pages: 14
Edition: 1

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ISO 17297:2025
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