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IEC 63616:2025

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method

Standard Details

IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 63616:2025
Document Year: 2025
Pages: 13
Edition: 1.0
  • Section Volume:
  • TC 46.SC 46F RF and microwave passive components
  • ICS:
  • 17.220.20 Measurement of electrical and magnetic quantities
  • 29.050 Superconductivity and conducting materials

Life Cycle

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ACTIVE
IEC 63616:2025
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