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IEEE/VITA Standard for Reliability Component Stress Analysis and Derating Specification
Abstract: This document describes an open standard for parts stress analysis and derating. It establishes uniform methods to increase a component’s reliability margin by decreasing the amount of applied stress (i.e., voltage, current, temperature, power, etc.) to an electronic, electrical, or electromechanical part. Reducing the stress levels improves device reliability/durability by reducing failure rates, thereby improving the reliability and availability of the product.
Keywords: derating, electrical stress, environmental stress, IEEE 2818™, reliability, VITA 51.4
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