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IEEE C62.59:2019

IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes

Standard Details

The basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications equipment or lines from surges are defined in this standard. It is intended that this standard be used for the harmo

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEEE C62.59:2019
Document Year: 2019
Pages: 41

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IEEE C62.59:2019

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