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IEEE 1450.1 : 2025

IEEE Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Standard Details

Abstract: An interface between digital test generation tools and test equipment is provided by Standard Test Interface Language (STIL). Extensions to the test interface language (contained in this standard) are defined that facilitate the use of the language in the design environment and facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.Keywords: advanced scan architecture, core, environment, fail feedback, IEEE 1450.1, lockstep, parallel patterns, parameterized data, pattern tiling, pragma, signal variable, SoC, system on chip, test protocolMultimedia: NSubscription Package: Testing, Instrumentation and Measurement, and Metric PracticeIEEE Normative references: 1450-2023Life Cycle: Revision of IEEE 1450.1-2005Publication Type: IEEE StandardPublication Date: 2025-06-26Page Count: 141Committee/Society: IEEE Computer Society/Test Technology

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEEE 1450.1 : 2025
Document Year: 2025
Pages: 141

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IEEE 1450.1 : 2025
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