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IEC 61967-6:2002/COR1:2010

Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

General Information

Status : ACTIVE
Standard Type: Corrigendum
Document No: IEC 61967-6:2002/COR1:2010
Document Year: 2010
Edition: 1.0
  • ICS:
  • 31.200 Integrated circuits. Microelectronics

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IEC 61967-6:2002/COR1:2010
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