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IEEE N42.31:2003

American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation

Standard Details

Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quan

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEEE N42.31:2003
Document Year: 2003
Pages: 40
  • ICS:
  • 17.240 Radiation measurements
  • 31.080.01 Semiconductor devices in general

Life Cycle

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IEEE N42.31:2003

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