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SAE

SAE J2052_201607 : 2016

Test Device Head Contact Duration Analysis

Standard Details

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.

Cross Reference: 49CFR 572,49CFRPart572,Su,ISO12351,J211/1_201403

General Information

Status : Stabilized
Standard Type: Main
Document No: SAE J2052_201607 : 2016
Document Year: 2016
Pages: 7

Life Cycle

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SAE J2052_201607 : 2016
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