24:[["$","title","0",{"children":"ISO 11505:2012 Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry"}],["$","meta","1",{"name":"description","content":"ISO 11505:2012 Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry <p> ISO 11505:2012

ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.

It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.

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ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.

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ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.

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ISO 11505:2012

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ISO 11505:2012

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