Knowledge Gateway
Unlock your learning potential with industry insights and standards that matter. Share your email to begin.
Unlock your learning potential with industry insights and standards that matter. Share your email to begin.
Status : Active
Standard Type : Main
Document No : ISO 23729:2022
Document Year : 2022
Pages : 15
Edition : 1
Section Volume : Scanning probe microscopy (ISO/TC 201/SC 9.)
This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.