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Status : Active
Standard Type : Main
Document No : ISO 5490:2025
Document Year : 2025
Pages : 19
Edition : 1
This document specifies procedures for the rating and statistical analysis of non-metallic inclusions (referred to as inclusions hereafter) using a scanning electron microscope (SEM) with an energy dispersive X-ray spectrometer (EDS), a backscattered detector (BSD) and automatic image analysis capabilities.