ASTM E3001 : 20

1.1 This practice describes a procedure to provide the basic education of characterization methods for nanometer-scale materials, to be taught at an undergraduate college level. This education should be broad and include a suite of characterization methods to prepare an individual to work in various capacities within one of the many areas in nanotechnology research, development, or manufacturing.

1.2 This practice may be used to develop or evaluate an education program for characterization in the nanotechnology field. It provides listings of key methods that are relevant to such a program, with a minimum number of these methods to be taught as a requirement for such an education. This practice does not provide specific course material to be used in such a program.

1.3 While no units of measurements are used in this practice, values stated in SI units are to be regarded as standard.

1.4 This standard does not purport to address all of the characterization methods for nanometer-scale materials, nor is it meant for use in certification processes. It is the responsibility of the user of this standard to utilize other knowledge and skill objectives as applicable to local conditions or required by local regulations.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.