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BS IEC 62047-43:2024

Semiconductor devices. Micro-electromechanical devices - Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices

General Information

Status : Definitive
Standard Type: Main
Document No: BS IEC 62047-43:2024
Document Year: 2024
Pages: 22

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BS IEC 62047-43:2024
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