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DIN

DIN EN IEC 60749-20-1 (DRAFT) : 2018

Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 47/2488/CDV:2018); German and English version prEN IEC 60749-20-1:2018

General Information

Status : ACTIVE
Standard Type: Main
Document No: DIN EN IEC 60749-20-1 (DRAFT) : 2018
Document Year: 2018
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

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ACTIVE
DIN EN IEC 60749-20-1 (DRAFT) : 2018
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