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SAE SSB1_001 : 2014

Qualification and Reliability Monitors

Standard Details

This document is an annex to EIA Engineering Bulletin SSB-1, Guidelines for Using Plastic Encapsulated Microcircuits and Semiconductors in Military, Aerospace and Other Rugged Applications (the latest revision).The scope of this document is to establish the recommended minimum qualification and monitoring testing of plastic encapsulated microcircuits and discrete semiconductors suitable for potential use in many rugged, military, severe, or other environments.

Cross Reference: CDF-AEC-Q100,CDF-AED-Q101,EIA J-STD-020,EIA JESD-22,EIA JESD-22A,MIL-STD-750

General Information

Status : Stabilized
Standard Type: Main
Document No: SAE SSB1_001 : 2014
Document Year: 2014
Pages: 14

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SAE SSB1_001 : 2014
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