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ISO 17915:2018

Optics and photonics — Measurement method of semiconductor lasers for sensing

Standard Details

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.

This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

General Information

Status : Published
Standard Type: Main
Document No: ISO 17915:2018
Document Year: 2018
Pages: 29
Edition: 1
  • ICS:
  • 31.260 Optoelectronics. Laser equipment

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ISO 17915:2018
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