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Status : Active
Standard Type : Main
Document No : ISO/TS 11888:2017
Document Year : 2017
Pages : 18
Edition : 2
Section Volume : Nanotechnologies (ISO/TC 229.)
ISO/TS 11888:2017 also includes additional terms needed to define the characterization of static bending persistence length (SBPL). Measurement methods are given for the evaluation of SBPL, which generally varies from several tens of nanometres to several hundred micrometres.
Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.