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Status : Active
Standard Type : Main
Document No : ISO 24173 : 2024
Document Year : 2024
Pages : 40
Edition : 2
Section Volume : Microbeam analysis (ISO/TC 202.)
This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.