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ISO 18452:2005

Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer

Standard Details

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

General Information

Status : Published
Standard Type: Main
Document No: ISO 18452:2005
Document Year: 2005
Pages: 9
Edition: 1

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ISO 18452:2005
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