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IEC 61445:2012

Digital Test Interchange Format (DTIF)

Standard Details

IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.

General Information

Status : ACTIVE
Standard Type: Main
Document No: IEC 61445:2012
Document Year: 2012
Pages: 101
Edition: 1.0
  • Section Volume:
  • TC 91 Electronics assembly technology
  • ICS:
  • 25.040.01 Industrial automation systems in general
  • 35.060 Languages used in information technology

Life Cycle

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ACTIVE
IEC 61445:2012
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