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IEC 60749-1:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Standard Details

Modification of the validity date: now put at 2007.

General Information

Status : ACTIVE
Standard Type: Corrigendum
Document No: IEC 60749-1:2002/COR1:2003
Document Year: 2003
Edition: 1.0
  • Section Volume:
  • TC 47 Semiconductor devices
  • ICS:
  • 31.080.01 Semiconductor devices in general

Life Cycle

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IEC 60749-1:2002/COR1:2003
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