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19/30404655 DC

BS EN IEC 63229. Semiconductor devices. The classification of defects in gallium nitride epitaxial film on silicon carbide substrate

General Information

Status : Definitive
Standard Type: Main
Document No: 19/30404655 DC
Document Year: 17
Pages: 23
  • Section Volume:
  • GBM21 Electronic Components & Devices (GMB21)

Life Cycle

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Definitive
19/30404655 DC
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